A Temperature Monitoring System for Electron Microscopy

A Temperature Monitoring System for Electron Microscopy

The temperature monitoring system has been developed using National Instrument Fieldpoint modular Distributed I/O. FieldPoint is designed for measurement, industrial control, and data logging applications that require reliable, rugged systems involving diverse sensors, such as platinum Resistance Temperature Detectors (RTDs). The programmation of these modules is done via LabVIEW, a powerfull graphical development environment.

Denis Fellmann